The Dielectric Assessment Kit for Thin Layers (DAK-TL) allows characterization of the dielectric properties of solid and semi-solid materials with limited thickness (0.1 – 10 mm) that are available in sheet form, and of liquid samples with volumes of 10 – 50 mL. The system, like DAK, is based on open coaxial probes and is equipped with electronics for automatic measurement of thickness and force. The dielectric parameters of the material under test are calculated from the reflection coefficient measured at the probe flange, the probe dimensions (diameters, bead permittivity), and the sample thickness. DAK-TL2 is composed of the probe beam mounted on the base unit. It is fully automated and software controlled. The sample platform brings the material under test to the probe and measures the sample thickness with micrometer accuracy. The applied force can be precisely controlled to enable high measurement repeatability for soft samples such as leather or soft plastic. The equipment is operable with almost all makes and models of VNA’s and is available in different configurations from 4 MHz-67GHz. In India, BNN has supplied this equipment to several educational institutions like IITs, Engineering Colleges, research institutions like ISRO etc.